D3286 Advantest Bit Error Rate Testers

Overview SDH/SONET Frame Synchronization Suitable for System Evaluation Burst Data Measurement Effective for Round-Trip Testing Error Location Function to Locate Error Bits Error Rate Measurement Function with Area Specification, Effective for Measurement of ATM Cell Automatic Adjustment to the Aimed Voltage at Optimum Timing with Any Mark-Space Rate and WORD Pattern 0/1 Recognition for Error Bits Monitor Output of Input and Clock Data Effective for Evaluation of Jitter and Waveform Quality Simple and Convenient Operating Environment with GUI (Graphical User Interface) Printer for Printing Measurement Results and Built-In FDD for Storing Measurement Results and Setting Data